Directional consistency of dark-field illumination for defect images
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.580058
Authors: Shaowen Wang, Lan Wu, Jianfeng Zheng, Shiwei Guo, Shiling Wang, Dong Liu
Institution: China Jiliang University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416915131