Work

Line projection profilometry

Year: 2025

Type: article

Source: Optics Letters

DOI: 10.1364/ol.583953

Authors: Qijian Tang, Yanfei Li, Xiaoli Liu

Institution: Shenzhen University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G2452215779, G7919969593, G8181742241

OpenAlex ID: W4416930721

FWCI: 0.375

Cites: 18

Cited by: 1

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