Work

Development of electron ptychography from algorithms, detectors to its applications

Year: 2025

Type: article

Abstract: Electron ptychography has emerged as a powerful computational imaging technique using four-dimensional scanning transmission electron microscopy, greatly exceeding the resolution limits of conventional electron microscopes by quantitative phase retrieval. This paper presents recent algorithmic developments and technological requirements for detectors used in electron ptychography, as well as applications in different fields of nanoscience. The application range covers high-resolution imaging of beam-sensitive specimens, light element detection, and three-dimensional reconstruction, making electron ptychography a versatile technique for materials characterization.

Source: Han-guk hyeonmigyeong hakoeji/Applied microscopy

DOI: 10.1186/s42649-025-00119-1

Authors: Wonwoo Suh, Jeewon B. Choi, Keun-Yeol Park, Celesta S. Chang

Institution: Seoul National University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: gold

Estimated APC paid: $2,590

Funders: Seoul National University, Samsung