Growth and analysis of low-resistivity polycrystalline SiC using the PVT method
Year: 2025
Type: article
Source: CrystEngComm
DOI: 10.1039/d5ce00878f
Authors: Anqi Wang, Fan Wang, Binjie Xu, Lingling Xuan, Shengou Lu, Xuefeng Han, Deren Yang, Xiaodong Pi
Institution: Zhejiang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416948358