Work

Effect of Indium Doping on the Reliability Characteristics of Chalcogenide GeSbSeTe Thin-Film-Based Selector-Only Memory Devices

Year: 2025

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.5c17898

Authors: Won Hee Jeong, Soo Hyun Lee, Gun Hwan Kim

Institution: Yonsei University

Language: English

Topic: Phase-change materials and chalcogenides

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Award: G162526083

OpenAlex ID: W4416952008

FWCI: 0.636

Cites: 53

Cited by: 3

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