Work

Multispectral low coherence interferometry for simultaneous material identification and thickness measurement

Year: 2025

Type: conference-paper

Source: Optifab

DOI: 10.1117/12.3053986

Authors: Paul M. Thomas, Don Gibson, Mike Marcus, John Pietruszka

Institution: Lumetrics (United States)

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4416966123

FWCI:

Cites: 2

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Related to: 10