A methodology for process design kit re-centering using TCAD and experimental data for cryogenic temperatures
Year: 2025
Type: article
Abstract: In this work, we describe and demonstrate a novel Technology Computer Aided Design (TCAD) driven methodology to re-center room-temperature Process Design Kits (PDKs) for cryogenic operation using a limited set of experimental measurements. Unlike previous approaches that relied on direct fitting of sparse measurements, our technique accounts for process-induced deviations by calibrating TCAD models to both room-temperature and cryogenic data. Compact models for all process corners are extracted from TCAD-generated target characteristics, enabling accurate cryogenic modeling without dedicated foundry support. This scalable, technology-independent method provides a practical path for cryogenic circuit design.
Source: Solid-State Electronics
Institution: University of Glasgow
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $2,410
Funder: Innovate UK
OpenAlex ID: W4417027756
