Year: 2025
Type: article
Abstract: Intelligent Fault Diagnosis (IFD) systems are integral to predictive maintenance and real-time monitoring but often encounter challenges such as data scarcity, non-linearity, and changing operational conditions. To address these challenges, we propose an enhanced transfer learning framework that integrates the Universal Adaptation Network (UAN) with Spectral-normalized Neural Gaussian Process (SNGP), WideResNet, and attention mechanisms, including self-attention and an outlier attention layer. UAN’s flexibility bridges diverse fault conditions, while SNGP’s robustness enables uncertainty quantification for more reliable diagnostics. WideResNet’s architectural depth captures complex fault patterns, and the attention mechanisms focus the diagnostic process. Additionally, we employ Optuna for hyperparameter optimization, using a structured study to fine-tune model parameters and ensure optimal performance. The proposed approach is evaluated on benchmark datasets, demonstrating superior fault identification accuracy, adaptability to varying operational conditions, and resilience against data anomalies compared to existing models. Our findings highlight the potential of advanced machine learning techniques in IFD, setting a new standard for applying these methods in complex diagnostic environments.
Source: Machines
Authors: Hadi Abbas, Ratna Babu Chinnam
Institution: Wayne State University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,896
OpenAlex ID: W4417036538