Combined, table-top extreme-ultraviolet ellipsometry and polarimetry for studying ultrafast processes in matter
Year: 2025
Type: article
Abstract: We demonstrate the characterization of the complete polarization state of broadband extreme-ultraviolet radiation produced via high-harmonic generation in a gas target, measured with a double-stage polarimeter and a reaction microscope. The ellipsometric parameters of the reflective optics used in the polarimeter—meaning the extinction ratios and phase shift—were determined simultaneously. The results serve as a basis for table-top extreme-ultraviolet polarimetric and ellipsometric measurements, allowing ultrafast studies of polarization-sensitive matter, which require exact knowledge of the polarization state of the ionizing radiation.
Source: Journal of Physics Photonics
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,700
OpenAlex ID: W4417064498
