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Go-flow platform for time-dependent system reliability modeling and analysis

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2025.3434

Authors: Chuanlong Jiang, Jun Yang, Zhanyu He, Chenyu Jiang

Institutions: China Electronic Product Reliability and Environmental Test Institute, South China University of Technology

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4417455309

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