Design of Type-I censored reliability qualification test based on subsystem test data in a parallel system
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Shijie Tan, Ping Jiang, Yunyan Xing
Institution: National University of Defense Technology
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4417455339
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