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A rapid packaging defect segmentation method based on enhanced UNet architecture

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2025.3593

Authors: Chenlu Liu, Biaobiao Ye, Xianzhou Li, Jing Li, Juanjuan Liu, Yingkui Gu

Institutions: Jiangxi University of Science and Technology, Jiangxi College of Applied Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4417455349

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