Remaining useful life (RUL) analysis of repairable multi-state components based on Markov process
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Xiaoxiao Li, Kongxuan Zhou, Chen Zhai, Mengfei Huang, Kunpeng Ye
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4417455429
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