Reliability life study of circuit breakers and their protection device
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Xingyu Li, Yiye Sun, Hu Guo, Jinying Xiong, Shuai Xiang, Yin Zhang, Jing Yang
Institution: Wuhan Ship Development & Design Institute
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4417455477
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