Work

Evaluation of atmospheric-neutron-induced failure rates in sic power diodes via spallation neutron irradiation

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2025.3821

Authors: Chao Peng, Hong Zhang, Zhangang Zhang, Teng Ma, Yujuan He, Zhifeng Lei

Institution: China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4417455564

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