Multiparametric degradation model of PMOSFETs under negative bias temperature stress
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Haodong Wang, Cen Chen, Chenyi Wang, Yi Guo, Junpeng Gao, Guofu Zhai
Institution: Harbin Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4417455594
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