Work

The New Nuv-Bsi Sipm Technology Optimized for Detection Efficiency and Radiation Tolerance

Year: 2025

Type: conference-abstract

Source: IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

DOI: 10.1109/nss/mic/rtsd57106.2025.11287803

Authors: A. Gola, F. Acerbi, P. Antonioli, F. Caso, S. Cherry, D. O. Elgewaily, A. Ficorella, P. Khachru, L. Parellada Monreal, E. Montagna, A. Montanari, S.I. Kwon, R. Nania, G. Paternoster, R. Preghenella, L. Rignanese, E. Rovati, N. Tosi

Institutions: Fondazione Bruno Kessler, FBK Center for Sensors & Devices, Istituto Nazionale di Fisica Nucleare, Sezione di Bologna, University of California, Davis

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Institutes of Health

Award: G9000089594

OpenAlex ID: W4417470725

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