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Investigation of Electrode Effects in Tlbr Device Stability

Year: 2025

Type: conference-abstract

DOI: 10.1109/nss/mic/rtsd57106.2025.11287543

Authors: H. Kim, J. F. Christian, Y. Ogorodnik, M. R. Squillante, V. V. Nagarkar

Institution: Radiation Monitoring Devices (United States)

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4417470937

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