Work

Dislocation Strain Field Mapping Using Dark-Field Electron Holography

Year: 2025

Type: article

Source: Microscopy Today

DOI: 10.1093/mictod/qaaf097

Authors: Yun-Yu Wang, Zhouguang Wang, Zhi Yang, Qiang Jin

Institution: Micron (United States)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W4417500681

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Cites: 16

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