Work

Low-Voltage Electron Microscopy (LVEM): Part II—Applications Where LVEM Provides Significant Benefit

Year: 2025

Type: article

Source: Microscopy Today

DOI: 10.1093/mictod/qaaf092

Authors: Daniela Vieira, Emad Shahnam, Jaromir Bacovsky, Jared Lapkovsky

Institution: Delong Instruments (Czechia)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W4417500684

FWCI: 0.343

Cites: 23

Cited by: 1

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