Work

Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen.

Year: 2006

Type: article

Source: EMV

Authors: Peter J. Reiser, Heyno Garbe, Giselbrecht Dietmar

Language: German

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W45314976

FWCI:

Cites: 1

Cited by:

Related to: 10