フッ素による酸化物In-Ga-Zn-O薄膜トランジスタの欠陥終端効果と信頼性に及ぼす影響 (シリコン材料・デバイス)
Year: 2015
Type: article
Source: IEICE technical report. Speech
Language: Japanese
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W560410227
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