Work

Development of combinatorial defect analysis with an intense positron microprobe

Year: 2014
Type: conference-paper
Abstract: Nagayasu Oshima1,∗, Yasuhiro Kamada2, Hideo Watanabe3, Atsushi Kinomura1,†, and Ryoichi Suzuki1 1Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305–8568, Japan 2NDE and Science Research Center, Faculty of Engineering, Iwate University, 4–3–5 Ueda, Morioka 020–8551, Japan 3Research Institute for Applied Mechanics, Kyushu University, Kasuga 816–8580, Japan †Present address: Research Reactor Institute, Kyoto University, Kumatori-cho, Osaka 590–0494, Japan
Language: English
Open Access status: gold
OpenAlex ID: W574334562
FWCI:
Cites: 1
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Related to: 10