Work

Defects in Microelectronic Materials and Devices

Year: 2008

Type: book

Source: CRC Press eBooks

DOI: 10.1201/9781420043778

Authors: Fleetwood, Daniel M., Pantelides, Sokrates ca. 20./21. Jh., Schrimpf, Ronald D.

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W575086725

FWCI: 5.059

Cites: 20

Cited by: 192

Related to: 10

Parts: 28