Work

Nanostructured SiGe thin Films Obtained Through MIC Processing

Year: 2015

Type: article

Source: Materials Today Proceedings

DOI: 10.1016/j.matpr.2015.05.076

Authors: M. Lindorf, H. Rohrmann, G.L. Katona, D.L. Beke, H.-F. Pernau, M. Albrecht

Institutions: University of Augsburg, Oerlikon (Liechtenstein), University of Debrecen, Fraunhofer Institute for Physical Measurement Techniques

Language: English

Topic: Advanced Thermoelectric Materials and Devices

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W650029642

FWCI: 0.231

Cites: 32

Cited by: 8

Related to: 10