Terahertz-Driven MeV Electron Bunch Compression and Streaking
Year: 2025
Type: conference-paper
Abstract: Electron bunches with ultra-short bunch length and ultra-high timing stability are crucial for various applications. To achieve these desired characteristics, there is a growing interest in employing Terahertz-driven techniques to manipulate and diagnose electron bunches. This paper presents a method capable of compressing and measuring electron bunch lengths. Theoretical and simulation results demonstrate that the bunch length of 54 is reduced to 4 fs by utilizing THz-driven resonant cavity compression, achieving a compression ratio of 13. Furthermore, we also verify the bunch compression using a terahertz-driven streak camera.
Source: JACOW
Authors: Xu, Yang, Fan, Kuanjun, Liu, Zhengzheng, Song, Yifang, Tsai, Cheng-Ying, Wang, Jian
Institution: Huazhong University of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W6888049057
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