Work

Losses Evaluation on Parallel Diodes Using a Double Pulse Test Circuit

Year: 2025

Type: conference-paper

Abstract: This paper aims to optimize efficiency by combining diodes, such as SiC Schottky or PiN Si in parallel. For each combination, conduction and switching losses are estimated using datasheet in addition to double pulse test circuit validation. The parallelization of each diode is studied to propose the best configuration.

Source: HAL (Le Centre pour la Communication Scientifique Directe)

DOI: 10.34746/epe2025-0122

Authors: Alves de Lima Henn, Gustavo, Reymond-Laruina, Frédéric, de Oliveira Filho, Herminio Miguel, Phulpin, Tanguy

Institutions: Université Paris-Saclay, CentraleSupélec

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W6890125434

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