Work

Supplementary document for Defocus-integration interferometric scattering microscopy for speckle suppression and enhancing nanoparticle detection on substrate - 6978633.pdf

Year: 2024
Type: supplementary-materials
Abstract: Details of theoretical modeling and experimental measurement.
Source: Figshare
Language: English
Open Access status: green
OpenAlex ID: W6902253998
Cites:
Cited by:
Related to: