Supplementary document for A Deep Learning Framework for Rapid Aberration Correction in Reflection Matrix Microscopy - 7493409.pdf
Year: 2025
Type: supplementary-materials
Abstract: Supplementary Information
Source: Figshare
Authors: Seong, Eunyoung, Kim, Dong-Young, Choi, Wonshik, Lee, Ye-Ryoung
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6902432098
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