Supplemental Material
Year: 2025
Type: supplementary-materials
Abstract: Details of the X-ray reflectivity patterns and XRD of a-LaAlO3 and TiO2 thin films, in-plane magnetoresistance for S10, and temperature dependence of phase coherence length.
Source: Figshare
Authors: Yan, Hong, Zhang, Zhaoting, Lim, Zhi Shiuh, Zeng, Shengwei, Yun, Jijun, Wang, Shuanhu, Zhang, Yupu, Jin, Kexin
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6902689042
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