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Compensation Techniques for Inductive-Distorted Measurements of Fast Transients in Double Pulse Test

Year: 2025

Type: conference-paper

Source: Publication Server of Bonn-Rhein-Sieg University of Applied Sciences (Bonn-Rhein-Sieg University of Applied Sciences)

DOI: 10.30420/566541387

Authors: Lottis, Christian, Sprunck, Sebastian, Sah, Bikash, Jung, Marco

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W6908740673

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