Voltage generation for Sawyer-Tower Coss loss measurement based on resonant converters
Year: 2025
Type: conference-paper
Abstract: Output capacitance losses in modern semiconductor devices become increasingly relevant with fast switching power converters. A new voltage generation approach is proposed to handle the highly variable capacitive load in a SawyerTower circuit. An LLC resonant converter is applied to generate the high voltage, high frequency sinusoidal excitation voltage, overcoming limitations of HF amplifiers. An external DC voltage source is introduced to prevent reverse conduction of the device under test, ensuring accurate charge-voltage (Q-V) characterization. Measurements under this voltage excitation are presented. The calculated dissipated energy is verified by thermal measurements observing the temperature rise of the DUT, showing less than 6 % deviation. This article presents a scalable and practical setup for power semiconductor characterization at high voltages.
Authors: Korn, Paul, Praast, Marcus, Komma, Thomas
Institution: Leipzig University of Applied Sciences
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6909077910
FWCI:
Cites:
Cited by:
Related to: