What's New in Keysight Device Modeling 2025
Year: 2024
Type: article
Abstract: Challenges in Device Modeling • Model extraction is increasingly time-consuming • Smaller process nodes • High-volume measurement data • Higher frequency/power • New materials • In-house Solutions • Limited features and scalability • Manual measurement and data processing • Tedious maintenance
Author: Ma, Long
Institution: Keysight Technologies (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6912080558
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