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Supplementary Material for Nonlinear Response of Microwave Impedance Microscopy

Year: 2025

Type: supplementary-materials

Abstract: Details on extracting nonlinear admittance parameters and solving the system of circuit equations.

Source: Figshare

DOI: 10.60893/figshare.apl.28645733

Authors: Waghmare, Amogh, Bromley, Joshua, Shan, Jun-Yi, Ma, Eric Y.

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W6921534934

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