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Live Monitoring of the Blocking Behaviour of an IGBT Module in the HV-H3TRB Test

Year: 2025

Type: conference-paper

Abstract: One of the main electrical characteristics of IGBT modules influenced by humidity-related degradation is the blocking behaviour. This paper presents an approach for online monitoring of the blocking behaviour during a accelerated ageing test based on the high voltage, high humidity, high temperature reverse bias (HV-H3TRB) test by injecting a constant current into the device under test.

Source: HAL (Le Centre pour la Communication Scientifique Directe)

DOI: 10.34746/epe2025-0193

Authors: Kostka, Benedikt, Mertens, Axel

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: green

OpenAlex ID: W6927896751

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