Significantly overestimated mobility and other inconsistencies in A. Liu et al., Nature 629, 798 (2024)
Year: 2024
Type: article
Abstract: This preprint provides a critical analysis of the thin-film transistor (TFT) characteristics published in A. Liu et al., "Selenium-alloyed tellurium oxide for amorphous p-channel transistors", Nature 629, 798 (2024), revealing significant inconsistencies within the published data set, in which (parts of) the data contradict to the claimed TFT mobility, thus showing that the reported mobility appears to be significantly overestimated.
Authors: Bruevich, Vladimir, Podzorov, Vitaly
Institution: Rutgers, The State University of New Jersey
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6930685620
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