Supplementary Material
Year: 2025
Type: supplementary-materials
Abstract: Details of PA-MBE film growth and characterisation, isotope annealing experiments, ToF-SIMS depth profiling, isotope-profile description, and MD simulations.
Source: Figshare
Authors: Liedtke, Simon, Kler, Joe, Perkampus, Caitlin, Ambaum, Sonja, Hoffmann, Georg, Bierwagen, Oliver, De Souza, Roger
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6940215713
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