Work

Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO

Year: 2024
Type: article
Author: FAN Jiawei, WU Lan, YAN Jingjing
Language: English
Subfield: Plant Science
Open Access status: closed
OpenAlex ID: W6940306282
FWCI: 0.224
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Cited by: 1
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