Work

Characterization and modelling of low-frequency noise in polysilicon thin-film source-gated transistors from subthreshold to saturation

Year: 2024

Type: article

Abstract: OUTLINE: Introduction Low-frequency noise of n-type polysilicon source-gated transistors- Subthreshold region- Above-threshold region Conclusion

Source: Zenodo (CERN European Organization for Nuclear Research)

DOI: 10.5281/zenodo.14624308

Authors: Chen, Qi, Kilchytska, Valeriya, Bestelink, Eva, Sporea, Radu A., Flandre, Denis, Van Brandt, Léopold

Institutions: UCLouvain, University of Surrey

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W6949116478

FWCI:

Cites:

Cited by:

Related to: