Work

Efficient Test Generation for Dynamic Features Leveraging Token-Level Input Commonalities

Year: 2024

Type: conference-paper

Abstract: Anonymous artifacts for ICSE 2025 NIER submission.

Source: Zenodo (CERN European Organization for Nuclear Research)

DOI: 10.5281/zenodo.13917145

Author: Anonymous

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W6949198904

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