Atomic force microscopy as a multimetrological platform for energy devices
Year: 2025
Type: article
Abstract: In this article, we present a comprehensive study utilizing atomic force microscopy (AFM) as a multimetrological platform for the characterization of novel energy harvesting devices, with a particular focus on optical nanomaterials – nanowires. Despite their challenging structure, AFM offers exceptional versatility in probing the dimensional and functional properties of nanowires at the nanoscale. We demonstrate the capabilities of AFM measurements to provide an extensive understanding of the structural, electrical, and spectroscopic properties of nanowires using different operational modes, including electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and conductive-AFM (C-AFM). Our findings establish AFM as an invaluable metrological tool for the development of cutting-edge energy harvesting technologies and optical nanomaterials.
Authors: Aslan, Hüsnü, Kaja, Khaled, Morán-Meza, José, Piquemal, François, Alvarez, José, Chauvin, Nicolas, Penuelas, José, Sønderskov, Steffan Møller, Regrenye, Philippe
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Funder: European Commission
Award: G3287971284
OpenAlex ID: W6949519648
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