Comparison and Review of ALD Target Materials for Quantum Dot Solar Cells: Al_2 O_3, TiO_2, ZnO, HFO_2, WN, and NiO
Year: 2024
Type: conference-paper
Abstract: In the Atomic Layer Deposition (ALD) method, the choice of target materials is critical for achieving precise control over thin film properties such as thickness, composition, and uniformity, which directly impact the performance of devices like quantum dot solar cells. The ability to deposit high-quality films with specific electrical, optical, and mechanical properties is essential for optimizing device efficiency and longevity. Each target material offers unique advantages and challenges, influencing the overall functionality and reliability of the final product. Therefore, careful selection and optimization of target materials are crucial for advancing technologies that rely on ALD. In the ALD method, Al_2 O_3 is prized for its excellent dielectric properties and thermal stability, making it ideal for insulating layers, while TiO_2 offers high refractive index and photocatalytic capabilities, suitable for optical coatings and sensors. ZnO provides transparency and conductivity for electronic applications, HFO_2 delivers high-k dielectric properties for semiconductor devices, WN serves as an effective diffusion barrier, and NiO is utilized for its electrochromic and catalytic properties
Author: Hosseinzadeh Dizaj, Mehran
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W6949703139
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