Work

Simulation of Space Charge Behavior in Silicone Gel Above Edge Termination Area of Power Chip

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

DOI: 10.1109/ceidp61745.2024.10907506

Authors: Koki Kishimoto, Kazutake Kadowaki, Hiroki Shiota, Hirotaka Muto

Institution: Mitsubishi Electric (Japan)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W6959749741

FWCI:

Cites: 10

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