Data Acquisition And Processing Platform Design For SHINE Wire Scanner
Year: 2024
Type: conference-paper
Abstract: The Shanghai High repetition rate XFEL and Extreme light facility (SHINE) accelerates electrons to 8GeV with a high repetition rate of up to 1MHz. For the transverse beam profile measurement in the high energy sections wire scanner is used as an essential part of the accelerator diagnostic system, providing the tool to measure small beam size in an almost non-destructive manner. The prototype of the data acquisition and processing platform of wire scanner is designed and installed at the Shanghai soft X-ray Free Electron Laser (SXFEL) for verification. The experimental results show that the platform can be used for the SHINE.
Source: JACOW
Authors: Dong,Jian, Chen,Fangzhou, Chen,Jie, Yu,Luyang, Yuan,Renxian, Cao,Shanshan
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W6962866083
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