Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques
Year: 2024
Type: conference-paper
Authors: Loku Singgappulige Rosantha Kumara, Loku Singgappulige Rosantha Kumara, Sakura Yoshikawa, Sakura Yoshikawa, Atsushi Shimizu, Atsushi Shimizu, Linwei Li, Linwei Li, Takayoshi Katase, Takayoshi Katase, Seo Okkyun, Seo Okkyun, Takeshi Watanabe, Takeshi Watanabe, Masugu Sato, Masugu Sato, Osami Sakata, Osami Sakata, Atsushi Fukuchi, Atsushi Fukuchi, Toshio Kamiya, Toshio Kamiya
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W6980099196
FWCI:
Cites:
Cited by:
Related to: