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HARV-SoC - A Fault-aware RISC-V SoC for Radiation Harsh Environments

Year: 2025

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Santos, Douglas, A, Dilillo, Luigi

Institution: Institut d'Électronique et des Systèmes

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W6991552556

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