50 nm InP HEMTs with Tgates Fabricated by Single-Step Electron Beam Lithography for High-Frequency Applications
Year: 2025
Type: conference-paper
Abstract: No abstract available.
Authors: Cheng, Huihua, Jiang, Long, Ofiare, Afesomeh, Shi, Jichun, Ju, Taiyu, Mcgenn, William, George, Danielle, Li, Chong
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7020922980
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