Year: 2024
Type: dissertation
Abstract: To enhance the research on thermoelectric materials and improve the performance of thermoelectric devices, accurate evaluation of thermal transport characteristics is essential. Conventional methods for assessing thermal transport properties have limitations in evaluating nano-scale materials or may suffer from measurement inaccuracies due to contact thermal resistance. In contrast, utilizing the thermoreflectance of metals and semiconductors allows for non-contact optical methods to directly measure the surface temperature of the material, with the added benefit of achieving micro-level spatial resolution. In this thesis, the time-domain thermoreflectance method based on thermoreflectance principles was employed to measure the thermal conductivity of thermoelectric thin films. Additionally, thermoreflectance microscopy was utilized to measure the temperature distribution during the operation of the thermoelectric leg. This introduces a novel approach that holds significance not only for the evaluation of thermal transport characteristics in thermoelectric materials and devices but also for a wide range of functional materials and components in the future.
Author: 김현범
Institution: Seoul National University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7030168944