Surface analysis of TiO2 nanoparticles using ToF-SIMS: The influence of sample preparation methods, studied in a VAMAS interlaboratory comparison
Year: 2024
Type: conference-paper
Abstract: International audience
Authors: Bennet, F., Optiz, R., Ghoreishi, N., Plate, K., Barnes, Jean-Paul, Bellew, A., Belu, Anna, Ceccone, G., de Vito, Eric, Delcorte, Arnaud, Franquet, Alexis, Fumagalli, F., Gilliland, D., Jungnickel, H., Lee, T., G., Poleunis, Claude, Rading, D, Shon, H., K., Spampinato, Valentina, Son, J., G., Wang, F, Wang, Y., C., Zhao, Y, Roloff, A, Tentschert, J, Radnik, J
Institutions: Federal Institute for Risk Assessment, Medtronic (United States), European Commission, Joint Research Centre, Joint Research Centre, KU Leuven, IMEC, Korea Research Institute of Standards and Science, Beijing National Laboratory for Molecular Sciences, Federal Institute For Materials Research and Testing
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7043693277
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