Work

Development of reference samples for calibrating resistance and current measurements in Conductive probe Atomic Force Microscopy

Year: 2025

Type: conference-paper

Source: INRIA a CCSD electronic archive server

Authors: Morán-Meza, José A., Chrétien, Pascal, Piquemal, François, Houzé, Frédéric, Ulysse, Christian, Harouri, Abdelmounaim

Institutions: Laboratoire National de Métrologie et d'Essais, Laboratoire de Génie Électrique et Électronique de Paris, Centre de Nanosciences et de Nanotechnologies

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7046251689

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